US US7908532B2

Automated system and processing for expedient diagnosis of broken shift …

Publication no.

US7908532B2
Priority date
2008-02-16
Filing date
2008-02-16
Published
2011-03-15
Granted
2011-03-15
Assignee
International Business Machines Corporation
Inventor

Joseph Eckelman

Abstract

(a) starting; (b) applying a plurality of Logic Built-In Self-Test (LBIST) test pattern sets to a scan chain using an IEEE 1149.1 compatible Joint Test Action Group (JTAG)) functional test function/exercisor circuit coupled to said scan chain using LBIST flavors; (c) collecting scan fail data …

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