CN CN108254671B
The application relates to interpolator based test program evaluation. One example includes a test system (100) that includes a printed circuit board (102) and a switched interposer board (104). The switched interposer board (104) includes a probe point (108), a first bus (112), a second bus (114), and a set of switches (106). Each switch (106) includes a first terminal ("1 COMM"), a second terminal ("2"), and a third terminal ("4"), the first terminal ("1 COMM") being coupled to a respective pin of the integrated circuit device (110), the second terminal ("2") being coupled to the first bus (112), and the third terminal ("4") being coupled to the second bus (114). Each of the set of switches (106) has a first state that selectively couples a pair of pins of the integrated circuit device (110) to one another over a first bus (112) during a short circuit test and a second state that selectively couples at least one pin of the integrated circuit device (110) to a probe point (108) over a second bus (114) during a voltage level spike test.
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