EP EP4787357A1
[0001] Microscopic light emitting diodes (micro-LEDs) systems having in situ current measurement circuits are described. An example micro-LED system includes a set of micro-LEDs formed in a display substrate and a set of pixel driver circuits formed in a backplane substrate, coupled to the display substrate, where a respective pixel driver circuit is to provide current to a respective micro-LED during a first mode of operation for the set of micro-LEDs. The micro-LED system further includes a current measurement circuit, formed in the backplane substrate, comprising an operational amplifier configured to drive a source-follower transistor. The micro-LED system further includes a set of pass transistors to, on a per pixel driver circuit basis, selectively redirect current from one or more of the set of pixel driver circuits to the current measurement circuit allowing for in situ measurement of the redirected current within the backplane substrate.
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