KR KR20090014914A

Os of probe card, evenness, leakage current measuring mean and the system

Publication no.

KR20090014914A
Priority date
2007-08-07
Filing date
2007-08-07
Published
2009-02-11
Assignee
(주)하이비젼시스템
Inventor

최두원

Abstract

Mounted inside the case with a predetermined number of pins, the OS, flatness and leakage current measurement system of the probe card, characterized in that consisting of a plurality of test boards collecting the measurement information of the probe card. The method of claim 2, The test boards are …

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