US US2014021970A1
[0000] A system and method for evaluating wafer test probe cards under real-world wafer test cell condition integrates wafer test cell components into the probe card inspection and analysis process. Disclosed embodiments may utilize existing and/or modified wafer test cell components such as, a head plate, a test head, a signal delivery system, and a manipulator to emulate wafer test cell dynamics during the probe card inspection and analysis process.
A document turning up in a search is not the same as a document that anticipates your claims. Our registered Patent Agents read the claims, not just the abstract, and tell you where you still have room.
Protect Your InventionBibliographic data via the European Patent Office's Open Patent Services (DOCDB) — republished here for research and prior-art review. This page is not legal advice, and its presence in our index says nothing about the validity or enforceability of the document. For the Indian legal position — status, oppositions, renewals — see InPASS.